Equipment Name: High Accelerated Life Test Chamber

Device model: PC-422R8

Test temperature: 105.0~133.3℃/100%RH

110.0~140.0℃/85%RH

Humidity range: 20 to 98%RH, ±2.5%RH

Temperature control accuracy: ±0.5℃

Temperature control accuracy: ±3%RH (at85%RH)

Applicable object: semiconductor device HAST test